Depth profiles of the majority carrier concentration and the minority carrier effective lifetime in gettered GaAs

Author: Andrievskii V.   Gorelenok A.   Zagorel’skaya N.   Kamanin A.   Shmidt N.  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1063-7850

Source: Technical Physics Letters, Vol.27, Iss.12, 2001-12, pp. : 1013-1015

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