Related content

Short-Range Six-Axis Interferometer Controlled Positioning for Scanning Probe Microscopy

By Lazar Josef   Klapetek Petr   Valtr Miroslav   Hrabina Jan   Buchta Zdenek   Cip Onrej   Cizek Martin   Oulehla Jindrich   Sery Mojmir  

Sensors, Vol. 14, Iss. 1, 2014-01 ,pp. : 877-886

MDPI

Access to resources Recommend Favorite

Specialized probes with nanowhisker structures for scanning probe microscopy

By  

Journal of Physics: Conference Series , Vol. 541, Iss. 1, 2014-10 ,pp. : 225-230

IOP Publishing

Access to resources Recommend Favorite

Fabrication and characterization of areal roughness specimens for applications in scanning probe microscopy

By Chen Yuhang   Zhang Xiangchao   Luo Tingting   Liu Xiaoning   Huang Wenhao  

Measurement Science and Technology, Vol. 24, Iss. 5, 2013-05 ,pp. : 55402-55410

IOP Publishing

Access to resources Recommend Favorite

Electrical Scanning Probe Microscopy: Investigating the Inner Workings of Electronic and Optoelectronic Devices

By Kuntze S.   Ban D.   Sargent E.   Dixon-Warren St.   White J.   Hinzer K.  

Critical Reviews in Solid State and Material Sciences, Vol. 30, Iss. 2, 2005-04 ,pp. : 71-124

Taylor & Francis Ltd

Access to resources Recommend Favorite

Investigation of inhomogeneities in thin films of high-temperature superconductors by scanning probe microscopy

By Vorob’ev A.   Vostokov N.   Gaponov S.   Klyuenkov E.   Mironov V.  

Technical Physics Letters, Vol. 25, Iss. 2, 1999-02 ,pp. : 154-156

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite