Author: Wang Quan Liu Shuai Zhang Jin Zhu Jun Ge Daohan Ren Naifei
Publisher: IOP Publishing
ISSN: 0960-1317
Source: Journal of Micromechanics and Microengineering, Vol.24, Iss.4, 2014-04, pp. : 45016-45023
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
By Basu Sarbani Adriyanto Feri Wang Yeong-Her
Nanotechnology, Vol. 25, Iss. 8, 2014-02 ,pp. :
High performance tunnel field-effect transistor by gate and source engineering
Nanotechnology, Vol. 25, Iss. 50, 2014-12 ,pp. :
By Cho Kyungjune Kim Tae-Young Park Woanseo Park Juhun Kim Dongku Jang Jingon Jeong Hyunhak Hong Seunghun Lee Takhee
Nanotechnology, Vol. 25, Iss. 15, 2014-04 ,pp. :
By Hwang Yu-Ren Chang Ingram Yin-ku Wang Ming-tsong Lee Joseph Ya-min
Integrated Ferroelectrics, Vol. 97, Iss. 1, 2008-01 ,pp. :
By Sun Lei Zhang Jianping Zhao Feiyu Luo Xiao Lv Wenli li Yao Ren Qiang Wen Zhanwei Peng Yingquan Liu Xingyuan
Nanotechnology, Vol. 26, Iss. 18, 2015-05 ,pp. :