Performance and breakdown behavior of graphene field-effect transistors with thin gate oxides

Author: Wang Quan   Liu Shuai   Zhang Jin   Zhu Jun   Ge Daohan   Ren Naifei  

Publisher: IOP Publishing

ISSN: 0960-1317

Source: Journal of Micromechanics and Microengineering, Vol.24, Iss.4, 2014-04, pp. : 45016-45023

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