A novel terminal structure for total dose irradiation hardened of a P-VDMOS

Author： Zhaohuan Tang Rongkan Liu Kaizhou Tan Jun Luo Gangyi Hu Ruzhang Li Huaping Ren Bin Wang

ISSN： 1674-4926

Source： Journal of Semiconductors, Vol.35, Iss.5, 2014-05, pp. : 54005-54008

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