Long-term reliability of Al2O3 and Parylene C bilayer encapsulated Utah electrode array based neural interfaces for chronic implantation

Author: Xie Xianzong   Rieth Loren   Williams Layne   Negi Sandeep   Bhandari Rajmohan   Caldwell Ryan   Sharma Rohit   Tathireddy Prashant   Solzbacher Florian  

Publisher: IOP Publishing

ISSN: 1741-2552

Source: Journal of Neural Engineering, Vol.11, Iss.2, 2014-04, pp. : 26016-26024

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