Alterations in the complex refractive index of copper oxide thin films as sensing effect for hydrogen sulfide monitoring

Author： Kneer Janosch   Boxberg Manuel   Busch Sebastian   Eberhardt André   Palzer Stefan   Wöllenstein Jürgen  

Publisher： Springer Publishing Company

ISSN： 0946-7076

Source： Microsystem Technologies, Vol.20, Iss.4-5, 2014-04, pp. : 607-613

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