Accounting for unknown systematic errors in Rietveld refinements: a Bayesian statistics approach

Publisher: John Wiley & Sons Inc

E-ISSN: 1600-5767|48|4|1201-1211

ISSN: 0021-8898

Source: JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.4, 2015-08, pp. : 1201-1211

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Abstract