Definition of a simple resolution criterion in an Apertureless Scanning Near-Field OpticalMicroscope (A-SNOM): contribution of the tip vibration and lock-indetection

Author： Bijeon J.-L.   Adam P.-M.   Barchiesi D.   Royer P.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|26|1|45-52

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.26, Iss.1, 2004-03, pp. : 45-52

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract

Related content

Magneto-optical Faraday imaging with an apertureless scanning near field optical microscope*

By Wioland H.   Bergossi O.   Hudlet S.   Mackay K.   Royer P.  

EPJ Applied Physics (The), Vol. 5, Iss. 3, 2010-03 ,pp. : 289-295

Edp Sciences

Access to resources Recommend Favorite

Detection of an evanescent field scattered by silicon tipsin an apertureless scanning near-field optical microscope*

By Laddada R.   Benrezzak S.   Adam P. M.   Viardot G.   Bijeon J. L.   Royer P.  

EPJ Applied Physics (The), Vol. 6, Iss. 2, 2010-03 ,pp. : 171-178

Edp Sciences

Access to resources Recommend Favorite

Imaging a GaAlAs laser diode in operation using apertureless scanning near-field optical microscopy*

By Wurtz G.   Bachelot R.   Royer P.  

EPJ Applied Physics (The), Vol. 5, Iss. 3, 2010-03 ,pp. : 269-275

Edp Sciences

Access to resources Recommend Favorite

Looking at the nanoscale: scanning near-field optical microscopy

By De Serio M.   Zenobi R.   Deckert V.  

TrAC Trends in Analytical Chemistry, Vol. 22, Iss. 2, 2003-02 ,pp. : 70-77

Elsevier

Access to resources Recommend Favorite

Production of gold tips for tip-enhanced near-field optical microscopy and spectroscopy: analysis of the etching parameters

By Billot L.   Berguiga L.   de la Chapelle M. L.   Gilbert Y.   Bachelot R.  

EPJ Applied Physics (The), Vol. 31, Iss. 2, 2005-08 ,pp. : 139-145

Edp Sciences

Access to resources Recommend Favorite