Imaging subwavelength holes in chromium films inscanning near-field optical microscopy. Comparison betweenexperiments and calculation

Author: Ducourtieux S.   Grésillon S.   Rivoal J. C.   Vannier C.   Bainier C.   Courjon D.   Cory H.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|26|1|35-43

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.26, Iss.1, 2004-03, pp. : 35-43

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Abstract