Contact-free investigation of the EL2-defect in the surface of GaAs wafers

Author： Gründig-Wendrock B.   Dornich K.   Hahn T.   Kretzer U.   Niklas J. R.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|27|1-3|363-366

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 363-366

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