Charge stability on thin insulators studied by atomic force microscopy

Author： Felidj N.   Lambert J.   Guthmann C.   Saint Jean M.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|12|2|85-91

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.12, Iss.2, 2010-03, pp. : 85-91

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