Simultaneous quantitative determination of strain and defect profiles within the active region along high-power diode laser bars by micro-photocurrent mapping

Author: Gerhardt A.   Tomm J. W.   Schwirzke-Schaaf S.   Nagle J.   Oudart M.   Sainte-Marie Y.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|27|1-3|451-454

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.27, Iss.1-3, 2010-03, pp. : 451-454

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Abstract