The role of nickel and titanium in the formation of ohmic contacts on p-type 4H-SiC

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Interface annealing characterization of Ti/Al/Au ohmic contacts to p-type 4H-SiC

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Improved Ni ohmic contact on n-type 4H-SiC

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Thermal stability of the current transport mechanisms in Ni-based Ohmic contacts on n- and p-implanted 4H-SiC

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