Correlation between defect-related electroluminescence and charge trapping in Gd-implanted SiO2 layers

Author： Prucnal S.   Sun J.M.   Nazarov A.   Tjagulskii I.P.   Osiyuk I.N.   Fedaruk R.   Skorupa W.  

Publisher： Springer Publishing Company

ISSN： 0946-2171

Source： Applied Physics B, Vol.88, Iss.2, 2007-07, pp. : 241-244

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