Impact of heavy ion irradiation on CMOS current mirrors based on SOI and bulk Si substrates: mismatch and output impedance

Author： Wu Weikang An Xia Tan Fei Chen Yehua Liu Jingjing Zhang Yao Zhang Xing Shen Dongjun Guo Gang Huang Ru

Publisher： IOP Publishing

E-ISSN： 1361-6641|30|11|115002-115008

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.30, Iss.11, 2015-11, pp. : 115002-115008

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