Publisher: Trans Tech Publications
E-ISSN: 1662-9507|2015|363|49-55
ISSN: 1012-0386
Source: Defect and Diffusion Forum, Vol.2015, Iss.363, 2015-06, pp. : 49-55
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Abstract
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Neutron Reflectometry for the Investigation of Self-Diffusion in Amorphous Silicon
Defect and Diffusion Forum, Vol. 2015, Iss. 363, 2015-06 ,pp. :