Tuning the instrument resolution using chopper and time of flight at the small‐angle neutron scattering diffractometer KWS‐2

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|6|1849-1859

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.6, 2015-12, pp. : 1849-1859

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