Author: Qinghua Mao Junlin Liu Xiaoming Wu Jianli Zhang Chuanbing Xiong Chunlan Mo Meng Zhang Fengyi Jiang
Publisher: IOP Publishing
ISSN: 1674-4926
Source: Journal of Semiconductors, Vol.36, Iss.9, 2015-09, pp. : 93003-93006
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Abstract