Extraction of the defect density of states in microcrystalline silicon from experimental results and simulation studies

Author： Tibermacine T.   Merazga A.   Ledra M.   Ouhabab N.  

Publisher： IOP Publishing

ISSN： 1674-4926

Source： Journal of Semiconductors, Vol.36, Iss.9, 2015-09, pp. : 93001-93005

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