Short defect characterization based on TCR parameter extraction

Author： Firiti A. Faujour D. Haller G. Moragues J.M. Goubier V. Perdu P. Beaudoin F. Lewis D.

Publisher： Elsevier

ISSN： 0026-2714

Source： Microelectronics Reliability, Vol.43, Iss.9, 2003-09, pp. : 1563-1568

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