On the Reliability of Post-CMOS and SET Systems

Publisher: IGI Global_journal

E-ISSN: 1941-6326|1|2|43-57

ISSN: 1941-6318

Source: International Journal of Nanotechnology and Molecular Computation (IJNMC), Vol.1, Iss.2, 2009-04, pp. : 43-57

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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Abstract