Integration of microwave termination based on TaN thin films on ferrite substrates

Author: Zhang Dainan   Ji Liang   Kolodzey James  

Publisher: Edp Sciences

E-ISSN: 1286-0050|72|1|10101-10101

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.72, Iss.1, 2015-09, pp. : 10101-10101

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