Physico-chemical characterization of multilayer YIG thin film deposited by rf sputtering

Author: Abdel Samad B.   Blanc-Mignon M.-F.   Roumie M.   Siblini A.   Chatelon J. P.   Korek M.  

Publisher: Edp Sciences

E-ISSN: 1286-0050|50|1|10502-10502

ISSN: 1286-0042

Source: EPJ Applied Physics (The), Vol.50, Iss.1, 2010-04, pp. : 10502-10502

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Abstract