Dielectric properties of thin insulating layers measured by Electrostatic Force Microscopy

Author： Riedel C.   Arinero R.   Tordjeman Ph.   Ramonda M.   Lévêque G.   Schwartz G. A.   de Oteyza D. G.   Alegría A.   Colmenero J.  

Publisher： Edp Sciences

E-ISSN： 1286-0050|50|1|10501-10501

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.50, Iss.1, 2010-04, pp. : 10501-10501

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