AN UNDERSTANDING OF IN SITU BORON DOPED POLYSILICON FILMS BY CHARACTERIZATION AND SIMULATION

Publisher: Edp Sciences

E-ISSN: 1764-7177|02|C2|C2-79-C2-85

ISSN: 1155-4339

Source: Le Journal de Physique IV, Vol.02, Iss.C2, 1991-09, pp. : C2-79-C2-85

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next