Fullerenes as the imaging element of the tip of an atomic force microscope

By Dedkov G.  

Technical Physics Letters, Vol. 23, Iss. 6, 1997-06 ,pp. : 469-471

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite

In Situ Roughness Measurements for the Solar Cell Industry Using an Atomic Force Microscope

By González-Jorge Higinio   Alvarez-Valado Victor   Valencia Jose Luis   Torres Soledad  

Sensors, Vol. 10, Iss. 4, 2010-04 ,pp. : 4002-4009

MDPI

Access to resources Recommend Favorite

Determination of the Elastic Properties of Tomato Fruit Cells with an Atomic Force Microscope

By Zdunek Artur   Kurenda Andrzej  

Sensors, Vol. 13, Iss. 9, 2013-09 ,pp. : 12175-12191

MDPI

Access to resources Recommend Favorite

Atomic wave packets in amplitude-modulated vertical optical lattices

By  

New Journal of Physics, Vol. 12, Iss. 6, 2010-06 ,pp. : 1138-1151

IOP Publishing

Access to resources Recommend Favorite

Simulation of the influence of the tip radius on the sensitivity of an atomic force microscope

By Pokropivnyi A.   Pokropivnyi V.   Skorokhod V.  

Technical Physics, Vol. 42, Iss. 12, 1997-12 ,pp. : 1435-1439

MAIK Nauka/Interperiodica

Access to resources Recommend Favorite