Analysis of Threshold Voltage Flexibility in Ultrathin-BOX SOI FinFETs †

Author: Endo Kazuhiko   Migita Shinji   Ishikawa Yuki   Matsukawa Takashi   O’uchi Shin-ichi   Tsukada Junji   Mizubayashi Wataru   Morita Yukinori   Ota Hiroyuki   Yamauchi Hitomi   Masahara Meishoku  

Publisher: MDPI

E-ISSN: 2079-9268|4|2|110-118

ISSN: 2079-9268

Source: Journal of Low Power Electronics and Applications, Vol.4, Iss.2, 2014-05, pp. : 110-118

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