Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS): A New Tool for the Analysis of Toxicological Effects on Single Cell Level

Author: Jungnickel Harald   Laux Peter   Luch Andreas  

Publisher: MDPI

E-ISSN: 2305-6304|4|1|5-5

ISSN: 2305-6304

Source: Toxics, Vol.4, Iss.1, 2016-02, pp. : 5-5

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Abstract