Shape Reconstruction Based on a New Blurring Model at the Micro/Nanometer Scale

Author： Wei Yangjie   Wu Chengdong   Wang Wenxue  

Publisher： MDPI

E-ISSN： 1424-8220|16|3|302-302

ISSN： 1424-8220

Source： Sensors, Vol.16, Iss.3, 2016-02, pp. : 302-302

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