Experimentally Observed Electrical Durability of 4H-SiC JFET ICs Operating from 500 °C to 700 °C

E-ISSN： 1662-9752|2017|897|567-570

ISSN： 0255-5476

Source： Materials Science Forum, Vol.2017, Iss.897, 2017-06, pp. : 567-570

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