Determination of bulk and interface density of states in metal oxide semiconductor thin-film transistors by using capacitance–voltage characteristics

Author： Wei Xixiong Deng Wanling Fang Jielin Ma Xiaoyu Huang Junkai

Publisher： Edp Sciences

E-ISSN： 1286-0050|80|1|10103-10103

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.80, Iss.1, 2017-10, pp. : 10103-10103

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