Ionizing irradiation effect on the current-voltage characteristics of the metal/ultra-thin oxide/semiconductor structures

Author： Kassmi K. Maimouni R. Sarrabayrouse G.

Publisher： Edp Sciences

E-ISSN： 1286-0050|8|2|171-178

ISSN： 1286-0042

Source： EPJ Applied Physics (The), Vol.8, Iss.2, 2010-03, pp. : 171-178

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