Reduction of Surface and PL Defects on n-Type 4H-SiC Epitaxial Films Grown Using a High Speed Wafer Rotation Vertical CVD Tool

Publisher： Trans Tech Publications

E-ISSN： 1662-9752|2018|924|108-111

ISSN： 0255-5476

Source： Materials Science Forum, Vol.2018, Iss.924, 2018-07, pp. : 108-111

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Abstract

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