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IOP Publishing

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Trapping phenomena in AlGaN and InAlN barrier HEMTs with different geometries

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GaN HEMT with AlGaN back barrier for high power MMIC switch application

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Simulation of temperature and electric field-dependent barrier traps effects in AlGaN/GaN HEMTs

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The role of the Ti and Mo barrier layer in Ti/Al metallization to AlGaN/GaN heterostructures at identical process conditions: a structural and chemical characterization

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