Quantitative electrostatic force microscopy with sharp silicon tips

Author: Fumagalli L   Edwards M A   Gomila G  

Publisher: IOP Publishing

E-ISSN: 1361-6528|25|49|495701-495709

ISSN: 0957-4484

Source: Nanotechnology, Vol.25, Iss.49, 2014-12, pp. : 495701-495709

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