Evaluation of Fluorinated Self‐Assembled Monolayer by Photoelectron and Near Edge X‐Ray Absorption Fine Structure Spectroscopy

Publisher： John Wiley & Sons Inc

E-ISSN： 1520-6440|98|11|35-40

ISSN： 1942-9533

Source： ELECTRONICS & COMMUNICATIONS IN JAPAN, Vol.98, Iss.11, 2015-11, pp. : 35-40

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