Enhanced stability of black phosphorus field-effect transistors with SiO2 passivation

Author: Wan Bensong   Yang Bingchao   Wang Yue   Zhang Junying   Zeng Zhongming   Liu Zhongyuan   Wang Wenhong  

Publisher: IOP Publishing

E-ISSN: 1361-6528|26|43|435702-435707

ISSN: 0957-4484

Source: Nanotechnology, Vol.26, Iss.43, 2015-10, pp. : 435702-435707

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