High-resolution high-sensitivity elemental imaging by secondary ion mass spectrometry: from traditional 2D and 3D imaging to correlative microscopy

Author： Wirtz T Philipp P Audinot J-N Dowsett D Eswara S

Publisher： IOP Publishing

E-ISSN： 1361-6528|26|43|434001-434022

ISSN： 0957-4484

Source： Nanotechnology, Vol.26, Iss.43, 2015-10, pp. : 434001-434022

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