Deep levels in silicon–oxygen superlattices

Author: Simoen E   Jayachandran S   Delabie A   Caymax M   Heyns M  

Publisher: IOP Publishing

E-ISSN: 1361-6641|31|2|25015-25022

ISSN: 0268-1242

Source: Semiconductor Science and Technology, Vol.31, Iss.2, 2016-02, pp. : 25015-25022

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Abstract