Experimental research of heavy ion and proton induced single event effects for a Bi-CMOS technology DC/DC converter

Author： Anlin He   Gang Guo   Shuting Shi   Dongjun Shen   Jiancheng Liu   Li Cai   Hui Fan  

Publisher： IOP Publishing

ISSN： 1674-4926

Source： Journal of Semiconductors, Vol.36, Iss.11, 2015-11, pp. : 115010-115014

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