Extended X-ray absorption fine structure (EXAFS) study of secondary phases in Yb2O3-doped Si3N4 ceramics

By Kizler P.   Kleebe H.J.   Aldinger F.   Ruhle M.  

Journal of Materials Science, Vol. 32, Iss. 2, 1997-02 ,pp. : 369-374

Springer Publishing Company

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An extended X-ray absorption fine structure investigation on the local environment of niobium ions in Nb2O5-doped SrTiO3 glass ceramics

By Mosel G.   Willfahrt M.   Banach U.   Hubert T.  

Journal of Materials Science, Vol. 32, Iss. 6, 1997-06 ,pp. : 1591-1597

Springer Publishing Company

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Extended X-ray absorption fine structure spectroscopy of amorphous IR transmitting optical materials

By Mondal K.   Lalvani S. B.  

Journal of Materials Science, Vol. 39, Iss. 3, 2004-02 ,pp. : 1065-1069

Springer Publishing Company

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Characterization of the cobalt component in the positive- electrode material of a nickel metal hydride battery using extended X-ray absorption fine structure

By Sato N.  

Journal of Materials Science Letters, Vol. 16, Iss. 8, 1997-08 ,pp. : 621-622

Springer Publishing Company

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Photoluminescence studies of rare earth (Er, Eu, Tm) in situ doped GaN

By Hommerich U.   Nyein E.E.   Lee D.S.   Heikenfeld J.   Steckl A.J.   Zavada J.M.  

Materials Science and Engineering: B, Vol. 105, Iss. 1, 2003-12 ,pp. : 90-95

Elsevier

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