X-ray diffuse scattering as a probe for thin film and interface structure

Publisher: Edp Sciences

E-ISSN: 1286-4897|4|9|1543-1557

ISSN: 1155-4320

Source: Journal de Physique III, Vol.4, Iss.9, 1994-09, pp. : 1543-1557

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next