Publisher： Edp Sciences
E-ISSN： 1286-4897|7|7|1451-1467
ISSN： 1155-4320
Source： Journal de Physique III, Vol.7, Iss.7, 1997-07, pp. : 1451-1467
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
HIGH RESOLUTION ELECTRON BEAM INJECTION IN SEMICONDUCTORS USING A SCANNING TUNNELING MICROSCOPE
Le Journal de Physique IV, Vol. 01, Iss. C6, 1991-12 ,pp. :
Access to resources
Recommend
STUDIES OF SEMICONDUCTORS WITH ELECTRON AND ION BEAMS
Le Journal de Physique Colloques, Vol. 45, Iss. C2, 1984-02 ,pp. :
Nanoindentation of semiconductors: experiment and atomistic simulations
Journal of Physics: Conference Series , Vol. 281, Iss. 1, 2011-02 ,pp. :
Access to resources