Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new insight into cellular relationships

Author: Sawai Takashi   Kamataki Akihisa   Uzuki Miwa   Ishida Kinji   Hanasaka Tomohito   Ochi Kensuke   Hashimoto Takahito   Kubo Takashi   Morikawa Akinari   Ochi Takahiro   Tohyama Koujiro  

Publisher: Oxford University Press

ISSN: 0022-0744

Source: Journal of Electron Microscopy, Vol.62, Iss.2, 2013-04, pp. : 317-320

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