Fabrication of a TEM sample of ion-irradiated material using focused ion beam microprocessing and low-energy Ar ion milling

By Jin Hyung-Ha   Shin Chansun   Kwon Junhyun  

Journal of Electron Microscopy, Vol. 59, Iss. 6, 2010-12 ,pp. : 463-468

Oxford University Press

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Specimen preparation for high-resolution transmission electron microscopy using focused ion beam and Ar ion milling

By Sasaki Hirokazu  

Journal of Electron Microscopy, Vol. 53, Iss. 5, 2004-10 ,pp. : 497-500

Oxford University Press

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Specimen preparation of porous Au for transmission electron microscopy using cryo ion-milling

By Tanabe Toyokazu  

Journal of Electron Microscopy, Vol. 60, Iss. 1, 2011-02 ,pp. : 35-37

Oxford University Press

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Comparison of TEM specimen preparation of perovskite thin films by tripod polishing and conventional ion milling

By Eberg Espen   Monsen smund F.   Tybell Thomas   van Helvoort Antonius T. J.   Holmestad Randi  

Journal of Electron Microscopy, Vol. 57, Iss. 6, 2008-12 ,pp. : 175-179

Oxford University Press

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Smart specimen preparation for freeze substitution and serial ultrathin sectioning of yeast cells

By Yamaguchi Masashi   Okada Hitoshi   Namiki Yuichi  

Journal of Electron Microscopy, Vol. 58, Iss. 4, 2009-08 ,pp. : 261-266

Oxford University Press

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