Fatigue analysis of high-speed photodiode submodule by using FEM

Author: Kim K.S.   Kim H.I.   Yu C.H.   Chang E.G.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.44, Iss.1, 2004-01, pp. : 167-171

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