Long time reliability study of soldered flip chips on flexible substrates

Author: Pahl B.   Kallmayer C.   Aschenbrenner R.   Reichl H.  

Publisher: Elsevier

ISSN: 0026-2714

Source: Microelectronics Reliability, Vol.44, Iss.2, 2004-02, pp. : 309-314

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next