Conductivity and distribution of charge on electroluminescent Si/SiO 2 structures investigated by electrostatic force microscopy

Author: Suominen T.   Paturi P.   Huhtinen H.   Heikkila L.   Hedman H.-P.   Punkkinen R.   Laiho R.  

Publisher: Elsevier

ISSN: 0169-4332

Source: Applied Surface Science, Vol.222, Iss.1, 2004-01, pp. : 131-137

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Abstract