![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Author: Morniroli J.P. No M.L. Rodriguez P.P. San Juan J. Jezierska E. Michel N. Poulat S. Priester L.
Publisher: Elsevier
ISSN: 0304-3991
Source: Ultramicroscopy, Vol.98, Iss.1, 2003-12, pp. : 9-26
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Related content
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Trace analyses from LACBED patterns
Ultramicroscopy, Vol. 83, Iss. 3, 2000-06 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Quantitative assessment of symmetry in CBED patterns
Ultramicroscopy, Vol. 70, Iss. 1, 1997-12 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
Automated identification of symmetry in CBED patterns: a genetic approach
By Hu G.B. Peng L.-M. Yu Q.F. Lu H.Q.
Ultramicroscopy, Vol. 84, Iss. 1, 2000-07 ,pp. :
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
![](/images/ico/ico_close.png)
![](/images/ico/ico5.png)
LACBED study of a 3 grain boundary in a Cu +6 at% Si alloy
By Kim H.S. Goodman P. Schwartzman A. Tulloch P. Forwood C.T.
Ultramicroscopy, Vol. 77, Iss. 1, 1999-05 ,pp. :