A comprehensive electron paramagnetic resonance study of influence of annealing on defect center in phosphorus ion-implanted C 60 films

Author： Fahim N.F. Kojima N. Yamaguchi M. Ohshita Y. Eid A. Barsoum B.

Publisher： Elsevier

ISSN： 1369-8001

Source： Materials Science in Semiconductor Processing, Vol.5, Iss.6, 2002-12, pp. : 483-490

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